发明名称 DOPING METHOD OF BARRIER REGION IN SEMICONDUCTOR DEVICE
摘要 An exposed active surface is prepared on a major surface of a semiconductor substrate. A source gas containing an impurity component is applied to the exposed active surface whereat a film of the impurity component is adsorbed so as to form a barrier region along the major surface of the semiconductor substrate. A semiconductor device is formed on the major surface of the semiconductor substrate and is protected by the barrier region.
申请公布号 CA2031254(A1) 申请公布日期 1991.06.02
申请号 CA19902031254 申请日期 1990.11.30
申请人 AOKI, KENJI;AKAMINE, TADAO;SAITO, NAOTO 发明人 AOKI, KENJI;AKAMINE, TADAO;SAITO, NAOTO
分类号 H01L21/225;H01L21/336;H01L21/762;H01L29/06;H01L29/10;(IPC1-7):H01L29/784;H01L21/335 主分类号 H01L21/225
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