发明名称 Heterobipolar transistor and method of fabricating the same
摘要 The present invention realizes a heterobipolar transistor using a SiGeC base layer in order to improve its electric characteristics. Specifically, the distribution of carbon and boron within the base layer is controlled so that the concentration of boron is higher than the concentration of carbon on the side bordering on the emitter layer, and upon the formation of the emitter layer, both boron and carbon are dispersed into a portion of the emitter layer that comes into contact with the base layer.
申请公布号 US7358546(B2) 申请公布日期 2008.04.15
申请号 US20060445240 申请日期 2006.06.02
申请人 FUJITSU LIMITED 发明人 SATO HIDEKAZU;SUKEGAWA TAKAE;SUZUKI KOUSUKE
分类号 H01L29/06;H01L21/331;H01L29/10;H01L29/24;H01L29/732;H01L29/737 主分类号 H01L29/06
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