发明名称 Superlattice strain relief layer for semiconductor devices
摘要 A GaN/AlN superlattice is formed over a GaN/sapphire template structure, serving in part as a strain relief layer for growth of subsequent layers (e.g., deep UV light emitting diodes). The GaN/AlN superlattice mitigates the strain between a GaN/sapphire template and a multiple quantum well heterostructure active region, allowing the use of high Al mole fraction in the active region, and therefore emission in the deep UV wavelengths.
申请公布号 US7547925(B2) 申请公布日期 2009.06.16
申请号 US20060356769 申请日期 2006.02.17
申请人 PALO ALTO RESEARCH CENTER INCORPORATED 发明人 WONG WILLIAM S.;KNEISSL MICHAEL A.;YANG ZHIHONG;TEEPE MARK;KNOLLENBERG CLIFF
分类号 H01L27/15;H01L33/04;H01L33/32 主分类号 H01L27/15
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