发明名称 Wien filter and electron microscope using same
摘要 A Wien filter is provided in which a reduced amount of secondary aberration is produced. This filter has 12 poles (P1-P12). These poles have front ends (P'1-P'12) facing the optical axis. These front ends have a 12-fold rotational symmetry about the optical axis (O) within the XY-plane perpendicular to the optical axis. <IMAGE>
申请公布号 EP1335402(B1) 申请公布日期 2016.07.06
申请号 EP20030250799 申请日期 2003.02.07
申请人 JEOL LTD. 发明人 LOPEZ, MARTINEZ G.;TSUNO, KATSUSHIGE
分类号 H01J37/05;H01J37/26 主分类号 H01J37/05
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