发明名称 |
LATERAL CHARGE STORAGE REGION FORMATION FOR SEMICONDUCTOR WORDLINE |
摘要 |
Devices and methods for forming charge storage regions are disclosed. In one embodiment, a semiconductor device comprises a semiconductor layer having a trench, charge storage layers formed at both side surfaces of the trench, a wordline buried in the trench in contact with the charge storage layers, and source-drain regions formed in the semiconductor layer at both sides of the trench. |
申请公布号 |
US2016204280(A1) |
申请公布日期 |
2016.07.14 |
申请号 |
US201615048886 |
申请日期 |
2016.02.19 |
申请人 |
Cypress Semiconductor Corporation |
发明人 |
Iwase Shin |
分类号 |
H01L29/792;H01L27/115;H01L23/522;H01L29/66 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a semiconductor layer having a trench; charge storage layers formed at both side surfaces of the trench; a wordline buried in the trench in contact with the charge storage layers; and a plurality of source-drain regions formed in the semiconductor layer at both sides of the trench. |
地址 |
San Jose CA US |