发明名称 LATERAL CHARGE STORAGE REGION FORMATION FOR SEMICONDUCTOR WORDLINE
摘要 Devices and methods for forming charge storage regions are disclosed. In one embodiment, a semiconductor device comprises a semiconductor layer having a trench, charge storage layers formed at both side surfaces of the trench, a wordline buried in the trench in contact with the charge storage layers, and source-drain regions formed in the semiconductor layer at both sides of the trench.
申请公布号 US2016204280(A1) 申请公布日期 2016.07.14
申请号 US201615048886 申请日期 2016.02.19
申请人 Cypress Semiconductor Corporation 发明人 Iwase Shin
分类号 H01L29/792;H01L27/115;H01L23/522;H01L29/66 主分类号 H01L29/792
代理机构 代理人
主权项 1. A semiconductor device, comprising: a semiconductor layer having a trench; charge storage layers formed at both side surfaces of the trench; a wordline buried in the trench in contact with the charge storage layers; and a plurality of source-drain regions formed in the semiconductor layer at both sides of the trench.
地址 San Jose CA US