发明名称 Apparatus and method for inspecting infrared solid-state image sensor
摘要 An apparatus includes: a current control unit to control an amount of constant current and supply a first and second constant currents to an infrared detection pixel; a constant current supply time control unit to control periods of time in which the first and second constant currents are supplied to the infrared detection pixel; an A-D converter to convert a first and second electrical signals from the infrared detection pixel into a first and second digital signals, the first and second electrical signals being generated when the first and second constant currents is supplied to the infrared detection pixel, respectively; a subtracting unit to calculate a difference between the first and second digital signals; and a determining unit to determine whether the infrared detection pixel is a defective pixel based on the absolute value of the difference calculated by the subtracting unit.
申请公布号 US9404963(B2) 申请公布日期 2016.08.02
申请号 US201314064588 申请日期 2013.10.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Honda Hiroto;Ishii Koichi;Funaki Hideyuki;Sasaki Keita
分类号 G01R31/00;G01R31/28;G01R31/26 主分类号 G01R31/00
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. An apparatus for inspecting an infrared solid-state image sensor including at least one infrared detection pixel that generates an electrical signal in accordance with an incident infrared ray and an amount of supplied constant current, the apparatus comprising: a current control unit configured to control the amount of constant current and supply a first constant current and a second constant current to the infrared detection pixel, the first constant current and the second constant current being different from each other; a constant current supply time control unit configured to control periods of time in which the first and second constant currents are supplied to the infrared detection pixel; an A-D converter configured to convert a first electrical signal and a second electrical signal from the infrared detection pixel into a first digital signal and a second digital signal, respectively, the first electrical signal being generated when the first constant current is supplied to the infrared detection pixel, the second electrical signal being generated when the second constant current is supplied to the infrared detection pixel; a subtracting unit configured to calculate a difference between the first digital signal and the second digital signal; and a determining unit configured to determine whether the infrared detection pixel is a defective pixel based on the absolute value of the difference calculated by the subtracting unit.
地址 Minato-ku JP