发明名称 |
X-RAY ANALYZER |
摘要 |
An X-ray analyzer includes: an excitation source for exciting a sample to radiate a characteristic X-ray; an X-ray detector that detects the characteristic X-ray; a collimator; at least one window that is provided between the sample and the X-ray detector and allows the characteristic X-ray to pass through; and a cooling unit that cools the window, wherein the window is laminated with one or more layer of an aluminum film and one or more layer of an insulating film, wherein a total thickness of the aluminum film of the at least one window is equal to or greater than 150 nm and is less than 300 nm, and wherein a size of the collimator is set such that a quantity of radiant heat to the X-ray detector of the atmospheric temperature when the window is not present is equal to or less than 10 µW. |
申请公布号 |
EP3054318(A1) |
申请公布日期 |
2016.08.10 |
申请号 |
EP20160154231 |
申请日期 |
2016.02.04 |
申请人 |
HITACHI HIGH-TECH SCIENCE CORPORATION |
发明人 |
TANAKA, KEIICHI;CHINONE, KAZUO |
分类号 |
G01T1/16;G01N23/22;H01L39/00 |
主分类号 |
G01T1/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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