发明名称 X-RAY ANALYZER
摘要 An X-ray analyzer includes: an excitation source for exciting a sample to radiate a characteristic X-ray; an X-ray detector that detects the characteristic X-ray; a collimator; at least one window that is provided between the sample and the X-ray detector and allows the characteristic X-ray to pass through; and a cooling unit that cools the window, wherein the window is laminated with one or more layer of an aluminum film and one or more layer of an insulating film, wherein a total thickness of the aluminum film of the at least one window is equal to or greater than 150 nm and is less than 300 nm, and wherein a size of the collimator is set such that a quantity of radiant heat to the X-ray detector of the atmospheric temperature when the window is not present is equal to or less than 10 µW.
申请公布号 EP3054318(A1) 申请公布日期 2016.08.10
申请号 EP20160154231 申请日期 2016.02.04
申请人 HITACHI HIGH-TECH SCIENCE CORPORATION 发明人 TANAKA, KEIICHI;CHINONE, KAZUO
分类号 G01T1/16;G01N23/22;H01L39/00 主分类号 G01T1/16
代理机构 代理人
主权项
地址