| 摘要 |
A method of testing the reflectivity of RF absorber materials utilizes an elongated chamber lined with RF absorber material and having a source antenna at one end, with the other end terminating in either a "short circuit", or a piece of RF absorber material which is to be tested. A probe antenna is moved along the axis of the chamber and the standing wave created by the source antenna and the reflection from the other end is recorded, first with the short circuit condition, and then with the test sample in place, and the results are compared to yield a figure for the reflectivity of the test sample.
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