发明名称 METHOD OF FABRICATING MOS TRANSISTOR HAVING SELF-ALIGNED SOURCE-DRAIN
摘要 The transistor including a polysilicon self-aligned source/ drain and double diffused drain using residual sidewall silicon oxide is formed by: (a) performing an active region and polysilicon gate on silicon substrate (45), followed by depositing silicon oxide (45,46) and silicon nitride (48); (b) depositing a PSG (45) with 500nm thickness on silicon substrate, the PSG thickness of gate part is half than that of other part; (c) removing the only PSG (49) layer of polysilicon gate (47) by reactive ion etching; (d) selective growing the polysilicon oxide (53) on gate part (55) after etching the PSG (50) on silicon substrate and silicon oxide (52) on polysilicon gate (47).
申请公布号 KR910008126(B1) 申请公布日期 1991.10.10
申请号 KR19890006543 申请日期 1989.05.16
申请人 ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 RYU JONG-SON;KANG SANG-HYON
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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