发明名称 |
METHOD OF FABRICATING MOS TRANSISTOR HAVING SELF-ALIGNED SOURCE-DRAIN |
摘要 |
The transistor including a polysilicon self-aligned source/ drain and double diffused drain using residual sidewall silicon oxide is formed by: (a) performing an active region and polysilicon gate on silicon substrate (45), followed by depositing silicon oxide (45,46) and silicon nitride (48); (b) depositing a PSG (45) with 500nm thickness on silicon substrate, the PSG thickness of gate part is half than that of other part; (c) removing the only PSG (49) layer of polysilicon gate (47) by reactive ion etching; (d) selective growing the polysilicon oxide (53) on gate part (55) after etching the PSG (50) on silicon substrate and silicon oxide (52) on polysilicon gate (47).
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申请公布号 |
KR910008126(B1) |
申请公布日期 |
1991.10.10 |
申请号 |
KR19890006543 |
申请日期 |
1989.05.16 |
申请人 |
ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
RYU JONG-SON;KANG SANG-HYON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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