发明名称 SINGLE-CRYSTAL X-RAY DIFFRACTION APPARATUS
摘要 PURPOSE:To shorten the measuring time of X-ray diffraction by continuously rotating a single-crystal sample with at least shafts in two directions at the different speeds to each other, rotating an X-ray detector in one plane under this state, and observing a diffracting line. CONSTITUTION:Worms 5 and 6 are intermeshed with gears 3 and 4 which are attached to coaxially arranged shafts 1 and 2. Screening plates 8 and 9 are provided on an arm whose base end is fixed to the gear 3. Small holes 10 and 11 are formed in these plates. An X-ray detector 12 is provided at the rear side of the plates. A stage plate 13 is further attached to the gear 4. A motor 14 which is fixed on the stage plate 13 is provided at 45 degrees with respect to the vertical shaft. A single crystal sample 15 which is attached to the tip of the shaft is provided on the intersection of the axial line (z) of the gears 3 and 4 and a horizontal straight line (y) passing the small holes 10 and 11. The stage plate 13 and the motor 14 are rotated by a plurality of times at the different speeds for every one driving. The X rays which are projected from an X-ray source 17 through a collimator 16 on the straight line (y) are inputted into the sample 15. The diffracted rays from the sample 15 are detected with an X-ray detector 12.
申请公布号 JPH03248048(A) 申请公布日期 1991.11.06
申请号 JP19900044639 申请日期 1990.02.27
申请人 RIGAKU CORP 发明人 OKANDA HITOSHI
分类号 G01N23/207 主分类号 G01N23/207
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