| 摘要 |
PURPOSE:To improve an S/N and defect detecting capacity by reducting the amplitude value of a noise echo depending on material structure from an ultrasonic reflection source. CONSTITUTION:An ultrasonic signal supplied to an ultrasonic receiver 11 is amplified, and is sent to an A/D converter 12. Converted digital data is supplied to waveform memories 141-14n via a waveform memory switch 13 switched synchronizing with an oscillator switch 10, and is stored, respectively. Meanwhile, plural inspection waveforms stored in the waveform memories 141-14n are sent to a minimum value forming signal processing circuit 15. The circuit 15 compresses the plural inspection waveforms having ultrasonic propagation paths different little by little stored in the waveform memories 141-14n, and one inspection waveform in which a material noise is reduced can be obtained. A processed inspection waveform is sent to a D/A converter 16, and is sent to a CRT 17 for inspection waveform display. In such a way, it is possible to improve the S/N for the detection of a defective echo and to improve the defect detection capacity. |
