| 摘要 |
The refractive index and thickness of ultrathin layers<1 mu m in thickness are determined by recording the layers, which have been applied to a solid support, by surface plasmon microscopy as a function of the angle of incidence of the incident laser beam, the method making it possible to determine layer thicknesses with a vertical resolution>/=0.1 nm and a simultaneous lateral resolution>/=5 mu m.
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