发明名称 Phase-locked timebase for electro-optic sampling
摘要 A phase-locked timebase for electrical and electro-optic sampling has an offset phase-locked loop for controlling the delay between a stimulus reference signal and a sample strobe signal. A reference signal source synchronizes a stimulus source for a device under test and also is input to the phase detector of a phase-locked loop. Also input to the phase-locked loop in the baseband section is a sample phase control signal. The output of the offset phase-locked loop is an integer multiple of the reference signal source that is delayed from the reference signal source by a controlled amount. The output of the offset phase-locked loop is input to a low noise synchronous detection circuit that mixes a response signal from the device with an impulse sample strobe generated from the output of the phase-locked loop. The mixed response signal is detected, integrated and output at a rate equal to or much lower than the sample rate, as determined by the integration time.
申请公布号 US5057771(A) 申请公布日期 1991.10.15
申请号 US19900539260 申请日期 1990.06.18
申请人 TETRONIX, INC. 发明人 PEPPER, STEVEN H.
分类号 G01D21/00;G01R31/308;G01R31/319;H03L7/093;H03M1/12 主分类号 G01D21/00
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