发明名称 METHOD FOR MATING CRYSTAL AZIMUTH OF INGOT
摘要 PROBLEM TO BE SOLVED: To provide a method for mating the crystal azimuth of a semiconductor ingot which can arrange the crystal azimuth of a cut surface to be a prescribed crystal azimuth correctly when a semiconductor wafer is cut. SOLUTION: The rotational adjustment quantity of a semiconductor ingot 1 is calculated in order to arrange the slope line azimuth of a crystal surface after rotational adjustment to be an aimed azimuth ha. After the displacement angle f1 of the azimuth of the notch 2 of a cut surface generated in the rotational adjustment of the semiconductor ingot 1 being calculated on the basis of the calculated rotational adjustment quantity, the rotational adjustment quantity of the semiconductor ingot 1 is calculated in order to arrange the slope line azimuth after the rotational adjustment to be the azimuth with the displacement angle f1 calculated from the aimed slope line azimuth ha corrected. An operation for calculating the displacement angle f1 of the azimuth of the notch 2 generated in the rotational adjustment corresponding to the calculated rotational adjustment quantity is repeated until the difference between the calculated displacement angle f1 and a previously calculated displacement angle f1 becomes smaller than an allowable error.
申请公布号 JP2000043031(A) 申请公布日期 2000.02.15
申请号 JP19980216019 申请日期 1998.07.30
申请人 NIPPEI TOYAMA CORP;TOSHIBA FA SYST ENG CORP 发明人 BANZAWA YOSHIAKI;UYAMA KIICHIRO
分类号 B28D5/02;(IPC1-7):B28D5/02 主分类号 B28D5/02
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