发明名称 METHOD AND APPARATUS FOR DIAGNOSING DETERIORATION OF COATING FILM
摘要 PROBLEM TO BE SOLVED: To solve such problem that a measuring error has been heretofore been noted first only at a stage of analyzing a measured result, because a connecting fault of a ground line, a deterioration fault of a conductive gel used, in the case of measuring or the like must be judged according to an operator's experience even though a measuring person needs to judge the measuring accuracy of the measured result. SOLUTION: The apparatus for diagnosing the deterioration of a coating film comprises a voltage applying means for applying a voltage, including a plurality of different frequencies between a substrate metal of the film and a measuring probe provided on a surface of the film, a current measuring means for measuring a current flowing to the film, and a judging means for judging the degree of the deterioration of the film based on a coating film impedance to each frequency, calculated from the measured result of the measuring means, and the predictive diagnosis of the degree of the deterioration of the film is done by measuring of the film impedance at two points of time different in progress, analyzing the measured result, and forming a lifetime curve of the film.
申请公布号 JP2002014067(A) 申请公布日期 2002.01.18
申请号 JP20000197584 申请日期 2000.06.30
申请人 TOSHIBA CORP 发明人 ITO WATARU;TAKEUCHI FUMIAKI;HIRATE TOSHIMASA
分类号 G01N27/02;G01N27/00;(IPC1-7):G01N27/02 主分类号 G01N27/02
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