| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a safe X-ray crystal structure analysis device wherein a sample or a part of a goniometer for sample retention is not brought into contact with a two-dimensional detection face, even if the camera length is changed. <P>SOLUTION: This X-ray crystal structure analysis device is equipped with a goniometer 3 rotatable around theχ-axis and theω-axis, while retaining the sample, a collimator 20 for irradiating the sample with parallel X-rays having a micro cross-section, and an X-ray detector (two-dimensional detector) 40 provided on the facing side to the collimator, for detecting an X-ray diffracted image by the sample. In the device, the X-ray detector 40 is constituted movably in the front-to-back direction relative to the goniometer 3. A blade 43 whose width is changed corresponding to the camera length is mounted on the tip of the X-ray detector 40, and the rotatable range of theω-axis is automatically restricted in response to the camera length by a limiter mechanism formed by installing a pair of limiters 50 arranged symmetrically with respect to the center line on anωrotating table 31 of the goniometer. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
