发明名称 PLASMA PROCESSING APPARATUS
摘要 A dry etching apparatus (11) is provided with a vacuum container (12) wherein an object (1) to be processed is arranged on a bottom wall side in an internal space (15); a plasma generating coil (36), which is arranged on an outer side upper part of the vacuum container (12) and is provided with a conductor (37) arranged to form a space (39A) in a plane view; a top wall (16), which closes an upper part of the internal space (15) and is provided with a transparent section (30) at a position corresponding to the space (39A) between the conductors (37) of the coil (36) in the plane view; and a camera (45), which is arranged at the upper part of the coil (36) and includes at least a part of the object in a view field through the space (39A) and the transparent section (30). The status of the object during plasma processing can be observed in real time.
申请公布号 KR20070089711(A) 申请公布日期 2007.08.31
申请号 KR20077014412 申请日期 2007.06.25
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 HIROSHIMA MITSURU;MIYAKE SUMIO;OKUNE MITSUHIRO;WATANABE SHOZOH;SUZUKI HIROYUKI
分类号 H01L21/3065 主分类号 H01L21/3065
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