发明名称 |
Thin film transistor panel having an etch stopper on semiconductor |
摘要 |
A thin film transistor panel includes an insulating substrate, a gate insulating layer disposed on the insulating substrate, an oxide semiconductor layer disposed on the gate insulating layer, an etch stopper disposed on the oxide semiconductor layer, and a source electrode and a drain electrode disposed on the etch stopper. |
申请公布号 |
US9443877(B2) |
申请公布日期 |
2016.09.13 |
申请号 |
US201514799060 |
申请日期 |
2015.07.14 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
Yun Pil-Sang;Kim Ki-Won;Ryu Hye-Young;Lee Woo-Geun;Choi Seung-Ha;Youn Jae-Hyoung;Chung Kyoung-Jae;Lee Young-Wook;Lee Je-Hun;Yoon Kap-Soo;Kim Do-Hyun;Yang Dong-Ju;Choi Young-Joo |
分类号 |
H01L29/04;H01L31/036;H01L27/12;H01L21/4757;H01L21/441;H01L21/475;H01L29/786;H01L29/66 |
主分类号 |
H01L29/04 |
代理机构 |
H.C. Park & Associates, PLC |
代理人 |
H.C. Park & Associates, PLC |
主权项 |
1. A panel comprising a thin film transistor, the panel comprising:
a substrate; a first electrode on the substrate; a first insulating layer on the first electrode; an oxide semiconductor pattern on the first insulating layer; an etch stopper on the oxide semiconductor pattern; a second electrode and a third electrode on the etch stopper and the oxide semiconductor pattern, wherein:
lateralmost sidewalls of the etch stopper are substantially aligned with lateralmost sidewalls of the oxide semiconductor pattern; anda work function of the second electrode and the third electrode is lower than a work function of the oxide semiconductor pattern. |
地址 |
Yongin-si KR |