发明名称 TEST SYSTEM FOR PERIPHERAL DEVICE
摘要 PURPOSE:To judge the cause of abnormality by referring to a constitution information table when input/output operation for the peripheral device ends abnormally and making the path where the operation ends abnormally ineffective, and sending an instruction for retrial to an input/output processor by using another effective path. CONSTITUTION:If the input/output operation ends abnormally during a test of the peripheral device 12, the constitution information table is referred to, the path where the operation ends abnormally is made ineffective, and another effective path is retrieved. An input/output retrying means 4 sends the instruction for the retrying of the input/output operation for the peripheral device 12 to input/output processors 8 and 9 by using the effective path. Consequently, even if a fault occurs to the input/output processors 8 and 9, channels, and peripheral processors 10 and 11, the test never ends abnormally and the use of the effective path is tried to easily judge which of the peripheral device 12, input/output processors 8 and 9, channels, and peripheral devices 10 and 11 causes the abnormality.
申请公布号 JPH03266155(A) 申请公布日期 1991.11.27
申请号 JP19900066534 申请日期 1990.03.16
申请人 NEC CORP 发明人 TAYA YASUSHI
分类号 G06F11/22;G06F13/00 主分类号 G06F11/22
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