发明名称 LOOPBACK TEST SYSTEM FOR TRANSMISSION LINE
摘要 <p>PURPOSE:To reduce the information to be provided for a test equipment and to find out a fault location in a short time by allowing each transmitter to set equipment information into information specific to the relevant equipment and to loop back the information upon the receipt of the test information and the equipment information from the test equipment. CONSTITUTION:When a test equipment 117 sends a set of test information and equipment information, a detection circuit 1 of a data transmitter 118 receives the test information through a line 7 and detects the information. Then a setting circuit 2 converts the equipment information from the test equipment 117 into the information specific to the transmitter 118, loops back the information to the line 10 via a changeover circuit 3 and sends it to the line 8 via a changeover circuit 6 together with the test information. As a result, only up to when the equipment information 12 of the equipment 119 is looped back to the test equipment 117, the test equipment 117 discriminates it that a fault 123 exists between the equipments 120 and 119. Thus, the test equipment has only to provide a few sets of information and a fault location is found out in a short time.</p>
申请公布号 JPH03278623(A) 申请公布日期 1991.12.10
申请号 JP19900076954 申请日期 1990.03.28
申请人 NEC CORP 发明人 NAKAMURA YUZO
分类号 H04B3/46 主分类号 H04B3/46
代理机构 代理人
主权项
地址