ELECTRICAL COMPONENT TESTING APPARATUS HAVING A TEMPERATURE-COMPENSATING CIRCUIT

摘要

In testing apparatus in which voltages are developed across an electrical component and a standard resistance and are compared to determine whether the resistance of the electrical component falls within desired limits, temperature-compensating circuitry is provided for modifying the voltage developed across the standard resistance in response to changes in temperature and as a direct function of the temperature coefficient of resistance of a specific electrically conducting material in the electrical component. The temperature compensating circuitry is adjustable over a preselected range in accordance with the percentage of the specific electrically conducting material in the electrical component, and is connected between the standard resistance and a comparator circuit so as to feed the modified voltage to the comparator circuit for comparison with the voltage developed across the electrical component.