发明名称 TEST PROGRAM GENERATING DEVICE
摘要 PURPOSE:To generate a most accurate test program with only a data processing from test programs taken from several tested objects without occupying a wiring test device by taking out one instruction in accordance with majority decision logic. CONSTITUTION:An instruction taking out means 101 takes out the instructions in parallel from plural test programs TP1-TPn which are mutually different from each other. A selective means 102 compares plural instructions which are taken out and selects one instruction by majority decision logic. Namely, the selective means 102 selects one instruction from the test programs TP1-TPn with differences in accordance with majority decision logic. Thus, the accurate test programs TP1-TPn can be obtained only by the data processing without using the wiring test device even if the test programs TP1-TPn taken out from the fault tested objects among plural test programs TP1-TPn are included.
申请公布号 JPH0430225(A) 申请公布日期 1992.02.03
申请号 JP19900135586 申请日期 1990.05.25
申请人 FUJITSU LTD 发明人 MIHO TAIICHI
分类号 G01R31/02;G01R31/28;G06F11/22 主分类号 G01R31/02
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