发明名称 LEAK TESTING APPARATUS AND METHOD
摘要 A method and apparatus for conditioning devices such as electronic components for fine and gross leak testing, the apparatus comprising means for introducing a fluid under pressure to the devices whereby the fluid will be forced into the interiors of leaky devices, and means for thereafter removing the fluid, while reclaiming same, whereupon the devices may be tested by conventional sniffing or weighing methods to determine those which leak.
申请公布号 US3675468(A) 申请公布日期 1972.07.11
申请号 USD3675468 申请日期 1970.11.25
申请人 RAYTHEON CO. 发明人 VINCENT C. CACCAMESI;AARON C. DER MARDEROSIAN
分类号 G01M3/22;(IPC1-7):G01M3/20 主分类号 G01M3/22
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