发明名称 TESTING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To shorten a testing time and to execute a simple test by testing an FB according to a program command to be executed by a processor PC included in the same system as a functional block FB. CONSTITUTION:When an FB 13 is tested, a PC 12 transmits a control signal of scan mode SM to the FB 13, and executes a testing logic right shift command. Thus, test data of a register 14 is applied to the FB 13, and data DT designated by the shift command is shifted in an F/F 17. Then, a control signal of a normal mode is applied to the FB 13, and a logic circuit 16 normally operates based on the DT of the F/F 17. Then, the PC 12 executes a testing logic left shift command, and applies a control signal of the SM to the FB 13. A test result of the operating result of the circuit 16 is fetched by the F/F 18, shifted out, and stored in the register 14. Since the test result is analyzed, the test can be simply executed in a short time.
申请公布号 JPH0455778(A) 申请公布日期 1992.02.24
申请号 JP19900165694 申请日期 1990.06.26
申请人 TOSHIBA CORP 发明人 YOSHIDA TOSHIYA
分类号 G01R31/28;G06F11/22;G06F11/267;H01L21/66 主分类号 G01R31/28
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