| 摘要 |
PURPOSE:To easily align an electrode mask to light receiving and emitting surfaces, to prevent lateral deviation of an electrode, and to improve yield of both image chips by disposing a lateral deviation detection mark provided in a direction perpendicular to the direction of the electrode on the surfaces in special positional relation to the electrode, near a lateral deviation detecting surface. CONSTITUTION:Reference numeral 2 denotes a light emitting diode and about 64 diodes are disposed on a line in one image chip. Numeral 4 denotes a light emitting surface, numeral 6 denotes a diffusion preventive layer of the periphery, and numeral 8 denotes an electrode crossing the center of the surface 4. The surface 4 has a size of 50 (direction perpendicular to an electrode 8) X60mum (direction parallel to the electrode 8). The surface 4 is disposed in density of 300 pieces per one inch. Numeral 20 denotes a lateral deviation detection mark, which is provided perpendicularly to the electrode 8, and disposed in parallel with the end of the surface 4 at a position separated 10mum from the end of the surface 4. The longitudinal accuracy of the electrode 4 is about 10mum. A plurality of scales 22 are engraved at both ends of the mark 20 at an interval of about 5mum, and both ends are aligned with the end of the surface 4. |
