发明名称 DEVICE AND METHOD FOR MEASURING WORK PIECE
摘要 A measuring apparatus of processing products and a method thereof are provided to perform processing and measurement through once setup, thereby removing an error value caused by repeated setup. A measure apparatus of a processing product comprises a processing device(100) and a computer(150). The processing device measures the processing product after processing a mold. The computer displays and stores the measurement result value corresponding to a processing location value of the processing product measured by the processing device. The processing device comprises a first controller(101) and a probe(103). The first controller performs a control operation so as to transmit the processing location value of the measured processing products to the computer. The probe processes the mold under control of the first controller, and measures the processing location value of the processing product.
申请公布号 KR20090000209(A) 申请公布日期 2009.01.07
申请号 KR20070010582 申请日期 2007.02.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SUNG WOOK;SONG, JIN YOUNG;KIM, JIN GYU;SONG, MYONG CHUL
分类号 G06Q50/00 主分类号 G06Q50/00
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