SEMICONDUCTOR DEVICE TEST SYSTEM

摘要

A test system for semiconductor device is provided, which makes the DC test implemented more simply than implementing the current load in the test header. A test system for semiconductor device comprises the test header(300) and the Hifix board(400). The test header tests the semiconductor device by using the test control apparatus(200). The HI-fix board establishes the electrical connection between the test header and the semiconductor device. The HI-fix board is equipped with the passive load(330). The passive load performs the DC test.