发明名称 METHOD OF MANUFACTURING OXIDE THIN FILM TRANSISTOR
摘要 There is provided a method of manufacturing an oxide thin film transistor (TFT). The method includes forming a gate electrode on a substrate, forming a gale insulating layer on the gate electrode, forming an oxide semiconductor layer including a channel layer on the gate insulating layer, forming a source electrode and a drain electrode separated from each other on the oxide semiconductor layer, first plasma processing the substrate on which the source electrode and the drain electrode are formed at a carbon (C) atmosphere, secondly plasma processing the substrate al a nitrogen oxide atmosphere, and sequentially forming a first protective layer and a second protective layer on the substrate.
申请公布号 US2016211353(A1) 申请公布日期 2016.07.21
申请号 US201514966125 申请日期 2015.12.11
申请人 Samsung Display Co., Ltd. 发明人 JO Jung Yun;BAE Su Bin;SEO Ki Seong
分类号 H01L29/66;H01L29/45;H01L29/786;H01L29/24;H01L21/475;H01L21/02 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of manufacturing an oxide thin film transistor (TFT), the method comprising: forming a gate electrode on a substrate; forming a gate insulating layer on the gate electrode; forming an oxide semiconductor layer including a channel layer on the gate insulating layer; forming a source electrode and a drain electrode separated from each other on the oxide semiconductor layer; first plasma processing the substrate on which the source electrode and the drain electrode are formed at a carbon (C) atmosphere; secondly plasma processing the substrate at a nitrogen oxide atmosphere: and sequentially forming a first protective layer and a second protective layer on the substrate.
地址 Yongin-City KR