发明名称 |
METHOD OF MANUFACTURING OXIDE THIN FILM TRANSISTOR |
摘要 |
There is provided a method of manufacturing an oxide thin film transistor (TFT). The method includes forming a gate electrode on a substrate, forming a gale insulating layer on the gate electrode, forming an oxide semiconductor layer including a channel layer on the gate insulating layer, forming a source electrode and a drain electrode separated from each other on the oxide semiconductor layer, first plasma processing the substrate on which the source electrode and the drain electrode are formed at a carbon (C) atmosphere, secondly plasma processing the substrate al a nitrogen oxide atmosphere, and sequentially forming a first protective layer and a second protective layer on the substrate. |
申请公布号 |
US2016211353(A1) |
申请公布日期 |
2016.07.21 |
申请号 |
US201514966125 |
申请日期 |
2015.12.11 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
JO Jung Yun;BAE Su Bin;SEO Ki Seong |
分类号 |
H01L29/66;H01L29/45;H01L29/786;H01L29/24;H01L21/475;H01L21/02 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing an oxide thin film transistor (TFT), the method comprising:
forming a gate electrode on a substrate; forming a gate insulating layer on the gate electrode; forming an oxide semiconductor layer including a channel layer on the gate insulating layer; forming a source electrode and a drain electrode separated from each other on the oxide semiconductor layer; first plasma processing the substrate on which the source electrode and the drain electrode are formed at a carbon (C) atmosphere; secondly plasma processing the substrate at a nitrogen oxide atmosphere: and sequentially forming a first protective layer and a second protective layer on the substrate. |
地址 |
Yongin-City KR |