发明名称 Methods of forming semiconductor device structures
摘要 A method of forming a semiconductor device structure. The method comprises forming a block copolymer assembly comprising at least two different domains over an electrode. At least one metal precursor is selectively coupled to the block copolymer assembly to form a metal-complexed block copolymer assembly comprising at least one metal-complexed domain and at least one non-metal-complexed domain. The metal-complexed block copolymer assembly is annealed in to form at least one metal structure. Other methods of forming a semiconductor device structures are described. Semiconductor device structures are also described.
申请公布号 US9431605(B2) 申请公布日期 2016.08.30
申请号 US201414546897 申请日期 2014.11.18
申请人 Micron Technology, Inc. 发明人 Sills Scott E.;Millward Dan B.
分类号 H01L21/20;H01L45/00 主分类号 H01L21/20
代理机构 TraskBritt 代理人 TraskBritt
主权项 1. A method of forming a semiconductor device structure, comprising: forming a patterned dielectric material comprising at least one dielectric structure and at least one opening over an electrode; forming a polymer material over and in contact with at least a surface of the electrode exposed by the at least one opening; exposing the at least one dielectric structure and the polymer material to a staining agent to form a metal-complexed assembly comprising at least one metal-complexed polymer structure; treating the metal-complexed assembly to form at least one metal structure; forming an active material comprising one or more of a chalcogenide compound, a transition metal oxide, and a silicon oxide in contact with the at least one metal structure and the at least one dielectric structure; and forming a structure in contact with at least a portion of the active material at a position overlying the at least one metal structure.
地址 Boise ID US