SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PURPOSE:To make it unnecessary to use a selector circuit during test operation by providing means for writing the output signal of a programmable logic array for test patterns on a RAM and for reading out to the external the output signal written on the RAM. CONSTITUTION:An LSI 101 has a PLA 121 and the RAM 106 installed therein. The test operation of the PLA 121 is controlled by a test control signal 33. PLA test input patterns are written on the RAM 106. Next the PLA test input patterns are read out from the RAM 106 and latched in a data latch 131. A selector 111 selects one PLA test input pattern. The PLA 121 outputs a PLA output 21 for the PLA test input pattern selected. The PLA output 21 is latched in a data latch 141 and written on the RAM 106. All of the PLA output data stored on the RAM 106 is analyzed and the PLA 121 is tested.