发明名称 MEASURING APPARATUS FOR THICKNESS BY RADIATION
摘要 PURPOSE:To obtain an apparatus being excellent in measurement accuracy and operability, by incorporating a source and a detecting device in one body. CONSTITUTION:Radiations 12 emitted from a source 6 are applied to an object 10, and back-scattering rays 14 caused by the collision of the radiations with atoms of this object 10 are detected to measure the thickness of the object 10. On the occasion, the source 6 and a scintillator 1, which is a detecting device of the back-scattering rays 14, are incorporated in one construction. Since the source 6 and the scintillator 1 can be disposed in close vicinity to each other, accordingly, the scattering rays 14 enter the incident surface of the scintillator 1 at a virtually right angle thereto, and therefore measurement with excellent accuracy is attained. Since the source 6 and the scintillator 1 are incorporated in one body, the two devices can be transported easily. In addition, it is unnecessary to match the positions of them with each other in another place of measurement, and thus an operation can be facilitated.
申请公布号 JPS63171307(A) 申请公布日期 1988.07.15
申请号 JP19870003833 申请日期 1987.01.09
申请人 KUBOTA LTD 发明人 INOUE SHIZUO;TANAKA NAOYA
分类号 G01B15/02;G01N23/203;G02B27/30 主分类号 G01B15/02
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