Test system with robot arm for delivering a device under test

摘要

A test system (100) for testing electronic devices includes a conveyor (130) to convey the electronic devices, a test fixture (112) to test the electronic devices, and a robot apparatus (102). The robot apparatus (102) has a robot arm (118) positionable within an accessible region (216) to deliver electronic devices from the conveyor (130) to the test fixture (112) via an arcuate path.