TEST SOCKET FOR EXAMINING TEMPERATURE CHARACTERISTIC OF MEMORY CHIP AND CONTROL SYSTEM HAVING THE SAME

摘要

A test socket for inspecting temperature characteristic of a memory chip and a control system having the same are provided to accurately check the temperature characteristic by providing exact test temperature to a peripheral area of the memory chip by disposing a temperature measuring gauge around the memory chip. A test socket(110) for inspecting temperature characteristic of a memory chip by exposing the memory chip to predetermined test temperature by heat flow supplied from a heat supply device is composed of: an inflow hole(112) functioning as a passage for the heat flow into the test socket; a chip mounting unit(114) for installing the memory chip in the test socket; a temperature measuring gauge(116) disposed in the test socket to generate a temperature measurement signal correspondent to the peripheral temperature of the memory chip; and a connection terminal unit(118) functioning as a connection terminal for receiving the temperature measurement signal from the temperature measuring gauge and transmitting the signal to an external control device.