发明名称 Semiconductor device method of generating semiconductor device pattern method of semiconductor device and pattern generator for semiconductor device
摘要 It is an object of the invention to effectively absorb a power noise and to implement the stable operation of a circuit. The invention provides a semiconductor device comprising a bypass capacitor including an MOS structure having a gate electrode formed to be extended from a power wiring region to a portion provided under an empty region which is adjacent to the power wiring region and has no other functional layer, and formed through a capacitive insulating film on a diffusion region having one conductivity type, and a substrate contact formed under a ground wiring region and fixing a substrate potential, wherein the bypass capacitor has a contact to come in contact with the power wiring which is formed on a surface of the gate electrode and has the diffusion region having the one conductivity type and a diffusion region of the substrate contact connected to each other.
申请公布号 US7307333(B2) 申请公布日期 2007.12.11
申请号 US20040496297 申请日期 2004.05.21
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 ITOH MITSUMI;SAWADA MASATOSHI;HONMA JUNKO;SHIMAZAKI KENJI;TSUJIKAWA HIROYUKI;BENNO HIROSHI
分类号 H01L29/00;G06F17/50;H01L21/82;H01L21/822;H01L27/02;H01L27/04 主分类号 H01L29/00
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