发明名称 INTERFERING ION REMOVING METHOD FOR SUPERIMPOSED FIELD TYPE MASS SPECTROMETER
摘要 PURPOSE:To remove interfering ions by energy filtering in a superimposed field type SIMS. CONSTITUTION:It is very difficult to analyze the mass with interfering ions under double-focusing conditions in a superimposed field type mass spectrometer as shown in the figure A. Under no double-focusing conditions, energy dispersion occurs as shown by the figure B or C. When the mass with no interfering ions is to be analyzed, a superimposed field section is set to satisfy the double- focusing conditions, and when the mass with interfering ions is to be analyzed, the superimposed field section is set out of the double-focusing conditions. Energy filtering can be performed, and interfering ions can effectively be removed.
申请公布号 JPH04237942(A) 申请公布日期 1992.08.26
申请号 JP19910004435 申请日期 1991.01.18
申请人 JEOL LTD 发明人 YAMADA TAKAHISA
分类号 G01N27/62;H01J49/32 主分类号 G01N27/62
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