| 摘要 |
PROBLEM TO BE SOLVED: To provide a technique which enables current measurement for each functional block, after chip manufacturing. SOLUTION: Supply of a clock signal to functional blocks other than a functional block being an object of current measurement out of a plurality of functional blocks (2A-2D) is stopped, and a built-in self test circuit and a scan circuit are operated in the functional block which is the object of current measurement. Under this condition, current flowing in a power source terminal (11) of a semiconductor integrated circuit chip is measured. Since the supply of the clock signal, here, to the other functional blocks excluding the functional block being the object of current measurement is stopped, current measurement for each functional block becomes possible. Moreover, since the current measurement for each functional block is made possible by measuring the current flowing through the power source terminal of the semiconductor chip (1), current measurement, after the manufacture of the chip, becomes possible. COPYRIGHT: (C)2008,JPO&INPIT
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