发明名称 METHOD OF FORMING A CONTACT PLUG IN SEMICONDUCTOR DEVICE
摘要 A method for forming a contact plug in a semiconductor device is provided to secure a low junction resistance without the damage of the semiconductor substrate and minimize the diffusion of the impurity to the semiconductor substrate by performing an anneal process with two steps when forming the contact plug. An insulating layer(120) with a contact hole exposing a junction area(114) is formed in the upper part of a semiconductor substrate(100) including a gate. A contact plug(124) is formed by filling the conductive film in a contact hole. A post anneal process of the contact plug and the insulating layer is performed. The post anneal process is performed as the first anneal process and the second anneal process. The first anneal process is performed by using RTP(Rapid Thermal Process) in a soak chamber.
申请公布号 KR20090000416(A) 申请公布日期 2009.01.07
申请号 KR20070064469 申请日期 2007.06.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, DONG HO
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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