发明名称 Reliable read operation for nonvolatile memory device with resistance material that reads data based on reference current
摘要 Provided is a nonvolatile memory device. The nonvolatile memory device may include a resistive memory cell, a reference current generator which provides a reference current, a reference signal generator which provides a reference signal indicating a reference time for data read based on the reference current, and a read circuit which receives the reference signal and reads data by comparing a ramp-up time of a cell current flowing through the resistive memory cell with the reference time.
申请公布号 US9361977(B2) 申请公布日期 2016.06.07
申请号 US201514612997 申请日期 2015.02.03
申请人 Samsung Electronics Co., Ltd. 发明人 Park Mu-Hui
分类号 G11C11/00;G11C13/00;G11C11/56;G11C29/02 主分类号 G11C11/00
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A nonvolatile memory device comprising: a resistive memory cell; a reference current generator configured to provide a reference current; a reference signal generator configured to provide a reference signal indicating a reference time for data read based on the reference current; and a read circuit configured to receive the reference signal and to read data by comparing a ramp-up time of a cell current flowing through the resistive memory cell with the reference time.
地址 Suwon-si, Gyeonggi-do KR