Ausrichtvorrichtung

摘要

1,203,925. Electron beam apparatus. COMMISSARIAT A L'ENERGIE ATOMIQUE. 12 May, 1969 [31 May, 1968], No. 24130/69. Heading H1D. A support for a sample holder in an electron beam diffraction apparatus is provided with six degrees of freedom. In Fig. 1 the sample 1 is mounted on a bevel pinion 2 which is freely rotatable about axis X-X1 and which is mounted on a yoke 4 rotatable Π15 degrees about axis Y-Y1 and mounted in turn on a support 12 which is rotatable Π80 degrees about axis O-O1. These three rotations are controlled by pinions 18-20 which can be rotated by concentric shafts 29-31 via toothed wheels 32-34 and rods 23-25. The outer shaft 29 is mounted within a support sleeve 28 adapted for translation along axes W-W1 and Z-Z1, and for rotation about axis Z-Z1 to provide the other three degrees of freedom. The sleeve 28 is mounted within a casing formed by two parts 50 and 53 which engage along a groove 60 and are relatively movable along the W-W1 axis by means of a screw 55; vacuum tight joints are provided by seals 51 and 67 and by bellows 54. The sleeve 28 is translatable along axis Z-Z1 by means of a capstan nut 61 co-operating with threads 63 on the sleeve, and is rotatable about this axis by means of a crankplate 69 carrying a screw (71, Fig. 5, not shown) engaging teeth formed in the external surface of the sleeve 28.