| 摘要 |
PURPOSE:To manage a quality without sacrificing a hybrid IC by disposing testing patterns of predetermined number for managing the quality on a margin of a periphery of a board. CONSTITUTION:A predetermined number of testing patterns for managing the quality in working steps in a manufacturing step of a hybrid IC are disposed on margins P1-P8 in which the IC of the periphery of a board 1 are not manufac tured, and the quality of the IC is managed by using the patterns. That is, tests for managing the quality in working steps of manufacturing steps of the IC are executed by the predetermined number of the patterns provided in a part to be finally discarded. Thus, it is required to alter a device for testing each time the type of the IC is changed. |
