发明名称 MEASURING APPARATUS FOR REFLECTION OF LIGHT
摘要 <p>PROBLEM TO BE SOLVED: To provide a measuring apparatus, for the reflection of light, by which information on a deep part inside an object to be inspected can be measured by using light in a wavelength region having a small penetration depth and by which a component in an organism such as fat, protein, sugar or the like absorbed in a wavelength region of 1000 to about 2500 nm is detected more precisely. SOLUTION: A measuring apparatus is provided with an irradiation part A in which reflected light from the irradiated part of a sample S is not made incident on a detector, in which only light radiated after it is passed through the inside of the sample S so as to be scattered is used as detecting light, in which a deep part can be measured, in which a component in an organism such as fat, protein, sugar or the like absorbed in a wavelength region of 1000 to about 2500 nm can be detected more precisely and in which the sample S is irradiated with light, a detection part B which detects light from the sample S and a light shielding part C which is installed between the irradiation part A and the detection part B. The light shielding part C shields reflected light which is directly incident on the detection part B from the surface of the sample S, and the detection part B detects only scattered light from the inside of the sample S radiated from the surface of the sample S on a side different from the irradiation part A with reference to the light shielding part C.</p>
申请公布号 JPH11230901(A) 申请公布日期 1999.08.27
申请号 JP19980027240 申请日期 1998.02.09
申请人 SHIMADZU CORP 发明人 TSUNASAWA YOSHIO;ODA ICHIRO
分类号 G01N33/48;A61B5/145;G01N21/17;G01N21/35;G01N21/359;G01N33/02;(IPC1-7):G01N21/35;A61B5/14 主分类号 G01N33/48
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