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发明名称
WAFER PROBING DEVICE
摘要
申请公布号
JPH11251379(A)
申请公布日期
1999.09.17
申请号
JP19980047782
申请日期
1998.02.27
申请人
TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP
发明人
NEBUTANI SHIYUNSUKE
分类号
G01R1/06;G01R31/28;H01L21/66;(IPC1-7):H01L21/66
主分类号
G01R1/06
代理机构
代理人
主权项
地址
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