发明名称 SEMICONDUCTOR APPARATUS, IMAGING DEVICE, AND MANUFACTURING METHODS THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor apparatus which has high reliability and is made compact by an inexpensive and simple method. <P>SOLUTION: The semiconductor apparatus 10 has a semiconductor chip 1 where a photodetecting element is formed, a light-transmissive member 2 opposed to the photodetecting element, an adhesion layer 3 formed enclosing the photodetecting element to bond the semiconductor chip 1 and light-transmissive member 2 to each other, and sealing resin 4 sealing a portion of the semiconductor chip, a side wall of the light-transmissive member 2, and a portion of the adhesion layer 3, wherein the adhesion layer 3 is formed of a thermoplastic adhesive and hole portions 4a are formed penetrating the sealing resin 4 to reach a top surface of the adhesion layer 3. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009021307(A) 申请公布日期 2009.01.29
申请号 JP20070181428 申请日期 2007.07.10
申请人 SHARP CORP 发明人 NAKAHASHI TAKAHIRO;KUSHINO MASAHIKO
分类号 H01L31/02;H01L27/14;H04N5/225;H04N5/335 主分类号 H01L31/02
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