发明名称 INSPECTION DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection device capable of performing the inspection work of a plurality of devices to be inspected as quickly as possible. SOLUTION: An inspection machine 21 inspects a plurality of organic EL displays D while being rotated around a rotation axis J1 in a state where the plurality of organic EL displays D are held on the curved surface of a maintenance wall 10 having a semi-cylindrical curved structure. Since the inspection device is different from a conventional inspection device for inspecting the plurality of organic EL displays while the inspection machine is linearly moved in two directions by using an XY stage, and the inspection machine 21 needs not be moved at the time of the inspection work, the time for the movement of the inspection machine 21 is not required. Therefore, the time required for inspection work by the movement time of the inspection machine 21 is reduced, and the time required for the inspection work of the plurality of organic EL displays D is reduced. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005233788(A) 申请公布日期 2005.09.02
申请号 JP20040043432 申请日期 2004.02.19
申请人 SONY CORP 发明人 ASAI NOBUTOSHI
分类号 G01N21/84;G01M11/00;G09F9/00;H01L51/50;H05B33/12;H05B33/14;(IPC1-7):G01M11/00 主分类号 G01N21/84
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