发明名称 X-ray fluorescent analysis apparatus
摘要 The change in the sample size and a change in background intensity due to the coexisting element are measured in real time to thereby automatically change a measurement time, the detection lower limit is kept constant, so that a fluorescent X-ray apparatus is provided that is capable of measuring every time in the same detection lower limit even in a case where there have existed a change in size of a sample, a change in sensitivity due to a difference in main ingredient, and a change of a magnitude in background due to an influence of a coexisting element.
申请公布号 US7289598(B2) 申请公布日期 2007.10.30
申请号 US20050264403 申请日期 2005.11.01
申请人 SII NANO TECHNOLOGY INC. 发明人 MATOBA YOSHIKI
分类号 G01N23/223;H05G1/38 主分类号 G01N23/223
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