发明名称 |
Printed circuit board test access point structures and method for making the same |
摘要 |
A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point structure is conductively connected to a trace at a test access point directly on top of the trace and along the z axis of the x-, y-, z-coordinate system above an exposed surface of the printed circuit board to be accessible for electrical probing by an external device.
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申请公布号 |
US7307222(B2) |
申请公布日期 |
2007.12.11 |
申请号 |
US20030670649 |
申请日期 |
2003.09.24 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
PARKER KENNETH P.;PEIFFER RONALD J.;LEINBACH GLEN E. |
分类号 |
H01R12/04;G01R31/02;G01R31/28;H05K1/02;H05K1/11;H05K3/34 |
主分类号 |
H01R12/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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