Methods for characterization of electronic circuits under process variability effects

摘要

A method for determining an estimate of statistical properties of an electronic system comprising individual components subject to manufacturing process variability is provided, the method comprising
(1) obtaining a description of the composition of said electronic system in terms of which individual components are used,
(2) obtaining statistical properties of the performance of individual components of the electronic system;
(3) obtaining information about execution of an application on the system;
(4) simulating execution of said application based on the obtained information about execution of the application on the system for a simulated electronic system realization constructed by selecting individual components with said obtained statistical properties determining the delay and energy of the electronic system;
(5) determining the statistical properties of the delay and energy of the electronic system;
(6) simulating execution of said application based on the obtained information about execution of the application on the system for another simulated electronic system realization constructed by selecting individual components with said obtained statistical properties determining the properties of delay and energy of the electronic system;
(7) updating the statistical properties of the delay and energy of the electronic system; and
(8) repetitively executing said steps (6) and (7).