Method and apparatus for measuring thickness of an object

摘要

An apparatus for measuring thickness of an object is provided. The apparatus includes a compression control system which further includes a movable platform, a compression sensor, and a switching device operatively coupled to the compression sensor. The apparatus also includes a measurement system operatively coupled to the switching device for receiving a signal representative of a toggle event at the switching device and configured to measure a gradient. The apparatus also includes a processing circuit operatively coupled to the switching device and the measurement system for measuring a thickness of the object upon receiving the signal representative of the toggle event at the switching device by using the gradient and a communication circuit for transmitting a measured thickness of the object to a remote database.

主权项

1. An apparatus for measuring thickness of an object, comprising:
a compression control system comprising:
a movable platform;a compression sensor;a switching device operatively coupled to the compression sensor; a measurement system operatively coupled to the switching device for receiving a signal representative of a toggle event at the switching device and configured to measure a gradient; a processing circuit operatively coupled to the switching device and the measurement system for measuring a thickness of the object upon receiving the signal representative of the toggle event at the switching device by using the gradient; and a communication circuit for transmitting a measured thickness of the object to a remote database via a wireless medium.