发明名称 DEVICE FOR VERIFYING MASK PATTERN OF INTEGRATED CIRCUIT
摘要 PURPOSE:To verify the mask patterns partially varying in geometrical design rules with high accuracy in a short period of time. CONSTITUTION:The respective verification results of a partial design rule verifying means 7, a region assigning design rule verifying means 8, and a design rule verifying means 10 are edited by a verification error editing means 15 and are outputted by a verification result outputting means 18. The mask pattern verification is executed for each of the mask patterns in correspondence to the respective different design rules by such constitution, by which the verification results are outputted.
申请公布号 JPH0527412(A) 申请公布日期 1993.02.05
申请号 JP19910207633 申请日期 1991.07.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 MIWA HISAHARU
分类号 G03F1/84;G06T1/00;H01L21/027;H01L21/66 主分类号 G03F1/84
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