发明名称 Highly integrated MOS memory units prodn. - is performed so that distances between mask edges in two masks are independent from each other
摘要 <p>The unit (1) is produced by the use of silicon-gate technology, by which troughs are etched in an oxide layer on a substrate, in which switching circuits are produced. Zones between the troughs are produced, in which the substrate is doped through a first mask in order to obtain electric insulation. Then the troughs are etched in the oxide layer using a second (trough) mask. The distance between adjacent mask edges is in the trough mask independent from the distance of adjacent mask edges inside the first mask. It is determined only by the required distance between adjacent troughs, while the mask edges in the first mask are spaced only in accordance with the minimum distance required by the mask production.</p>
申请公布号 DE2723415(A1) 申请公布日期 1978.12.07
申请号 DE19772723415 申请日期 1977.05.24
申请人 SIEMENS AG 发明人 HOFMANN,RUEDIGER,DR.
分类号 H01L21/033;H01L21/761;(IPC1-7):01L21/72 主分类号 H01L21/033
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